A survey of leakage reduction techniques in CMOS digital circuits for nanoscale regime

Autor:	Vijay Kumar Sharma
Rok vydání:	2021
Předmět:	Very-large-scale integration Reduction (complexity) CMOS Computer science business.industry Cmos digital circuits Electrical engineering Leakage power Electrical and Electronic Engineering business Nanoscopic scale Leakage (electronics)
Zdroj:	Australian Journal of Electrical and Electronics Engineering. 18:217-236
ISSN:	2205-362X 1448-837X
Popis:	The battery-driven portable systems are the lifeline of the modern era. Very large-scale integration (VLSI) designers are continuously working to enhance the performance of the portable systems. Th...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ed419d559f9327eb238a092457a43525 https://doi.org/10.1080/1448837x.2021.1966957 Zobrazit plný text záznamu