Low power radiation tolerant VLSI for advanced spacecraft

Autor:	H.F. Benz, Jody W. Gambles, Sterling R. Whitaker, Pen-Shu Yeh, Gary K. Maki, K.J. Hass
Rok vydání:	2003
Předmět:	Very-large-scale integration Engineering CMOS Spacecraft business.industry Single event upset Absorbed dose Low-power electronics Electrical engineering Electronic engineering Electronics Integrated circuit design business
Zdroj:	Proceedings, IEEE Aerospace Conference.
Popis:	The combination of two synergistic VLSI technologies, ultra low power CMOS and radiation tolerant by design, offers an opportunity to provide advanced electronics capabilities for future spacecraft. The 500 mV CMOS process can yield orders of magnitude power reduction compared to current space-flight technologies and the radiation tolerance provides immunity against single event latch-up, good single event upset resistance and total ionizing dose immunity of at least 200 krads(Si). A study based on the EO-1 spacecraft requirements indicates that the use of these technologies could provide spacecraft power savings of 73% and total mass savings of 16%.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ed29da22a524c5ce765885e4e1c71229 https://doi.org/10.1109/aero.2002.1035413 Zobrazit plný text záznamu