The Study on Fatigue Lifetime Evaluation on the Interconnect of Diaphragm Type Pressure Sensor According to Various

Autor:	Jin-Hwe Kweon, Jae-Joon Shim, Jinho Choi, Sun-Chul Huh
Rok vydání:	2008
Předmět:	Computational Mathematics Interconnection Materials science General Materials Science Diaphragm (mechanical device) General Chemistry Electrical and Electronic Engineering Composite material Condensed Matter Physics Pressure sensor
Zdroj:	Journal of Computational and Theoretical Nanoscience. 5:1763-1767
ISSN:	1546-1963 1546-1955
DOI:	10.1166/jctn.2008.870
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ed16a712dc26e752020b65173a2b1003 https://doi.org/10.1166/jctn.2008.870 Zobrazit plný text záznamu