Characterization of thin-film optical properties by THz near-field imaging method
| Autor: | François Blanchard, F. Amirkhan, Koichiro Tanaka, Takashi Arikawa, R. Sakata, Tsuneyuki Ozaki, K. Takiguchi |
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| Rok vydání: | 2019 |
| Předmět: |
Materials science
business.industry Terahertz radiation Lithium niobate Physics::Optics Statistical and Nonlinear Physics 01 natural sciences Atomic and Molecular Physics and Optics Magnetic field Characterization (materials science) 010309 optics Resonator chemistry.chemical_compound chemistry Electric field 0103 physical sciences Optoelectronics Sensitivity (control systems) Thin film business |
| Zdroj: | Journal of the Optical Society of America B. 36:2593 |
| ISSN: | 1520-8540 0740-3224 |
| DOI: | 10.1364/josab.36.002593 |
| Popis: | We present a new method to characterize thin-film electro-optic materials. The method is based on resolving the electric and/or magnetic field distributions in the near-field region of a split-ring resonator (SRR) designed for the terahertz (THz) frequency range. We experimentally validate our simulations by THz near-field imaging of SRRs directly patterned in contact with a thin-film lithium niobate crystal as a sensor. Furthermore, we analytically study the effect of the different applied electric field polarizations and calculate the sensitivity of the sensor via various polarizations of probe beams. |
| Databáze: | OpenAIRE |
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