Magnetoresistance study of a thin α-tungsten film
| Autor: | A. Sherman, A. Stolovits, O. Meier, M. Sisti, T. Avarmaa |
|---|---|
| Rok vydání: | 1998 |
| Předmět: |
Superconductivity
Materials science Magnetoresistance Condensed matter physics Scattering Dephasing Scattering length Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Magnetic field Condensed Matter::Materials Science Tungsten film Condensed Matter::Superconductivity Condensed Matter::Strongly Correlated Electrons Order of magnitude |
| Zdroj: | Physical Review B. 58:11111-11114 |
| ISSN: | 1095-3795 0163-1829 |
| DOI: | 10.1103/physrevb.58.11111 |
| Popis: | The resistance of an a-tungsten film was measured in the temperature range 0.35‐30 K and in the magnetic field up to 2.5 T. The obtained dependences of the magnetoresistance are interpreted in terms of the MakiThompson-Larkin superconducting fluctuation effect; however, the magnitude of the magnetoresistance exceeds the theoretical value by an order of magnitude. From the magnetoresistance data the dephasing scattering length was determined and the contributions of magnetic impurities, electron-electron, and electron-phonon scatterings were extracted. The experimental electron-electron and electron-phonon scattering lengths are satisfactorily described by the existing theory. @S0163-1829~98!04641-4# |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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