Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost

Autor:	M. Kawabata, Daisuke Watanabe, Masahiro Ishida, Kiyotaka Ichiyama, T. Fujibe
Rok vydání:	2012
Předmět:	Engineering Comparator Noise measurement business.industry Binary number Signal Test (assessment) Hardware and Architecture Electronic engineering Electrical and Electronic Engineering business Software Real-time testing Jitter Voltage
Zdroj:	IEEE Design & Test of Computers. 29:63-71
ISSN:	0740-7475
DOI:	10.1109/mdt.2012.2210382
Popis:	This paper proposes a real-time testing method for multilevel signal interfaces. It utilizes multilevel drivers that can modulate both the voltage and timing of an output signal, and multilevel comparators based on a dynamic threshold concept. The authors also consider the impact on test cost of the proposed system and compares that cost with a conventional binary test system.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ecc5a32f779ac7272904912948f5afab https://doi.org/10.1109/mdt.2012.2210382 Zobrazit plný text záznamu