Influence of Stylus System Configuration on the Variability of Measurement Result on CMM
| Autor: | Petr Mikeš |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
0209 industrial biotechnology
Computer science System of measurement Mechanical engineering 02 engineering and technology Industrial and Manufacturing Engineering Standard deviation Metrology Length measurement 020303 mechanical engineering & transports 020901 industrial engineering & automation Quality (physics) 0203 mechanical engineering Transmission (telecommunications) Measurement uncertainty Stylus |
| Zdroj: | Manufacturing Technology. 16:184-188 |
| ISSN: | 2787-9402 1213-2489 |
| DOI: | 10.21062/ujep/x.2016/a/1213-2489/mt/16/1/184 |
| Popis: | The article deals with the measurement on CMMs with tactile stylus system. Accuracy of CMM is mostly indicated by the parameter MPEE (Maximum Permissible Error for length measurement). This parameter refers to an errors during the measurement of distance between two points in space. Verification of MPEEparameter is described in an ISO standard 10 360-2 Acceptance and re-verication tests for coordinate measuring machines. These acceptance and re-verification tests are often conducted with a short and stiff reference stylus which is not and also mostly cannot be used in real measurements. On the contraryin applications such as a measurement of engine blocks and transmission housings very complex styli configurations are used. The influence of stylus system configuration on the variability of measurement when using long extensions, different materials (aluminium, carbon fiber composites) and high scanning speed in not described. The aim of this article is to design a methodology for testing the styli systems used in complex metrology applications in quality control of hi-precision mechanical components, to analyze the contribution of stylus system configuration to the measurement system variability in the form of a standard measurement uncertainty described by standard deviation. |
| Databáze: | OpenAIRE |
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