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Instrumentation for high-precision in-flight focusing of on- board optoelectronic equipment is described. The first part of the paper gives an overview of the existing focusing techniques and describes their application for particular remote sensing task solutions. A comparison of different methods is made, the accuracy provided by each method is assessed and one of the best techniques--a contrast method-- is considered. This method is shown to provide high precision--5 micrometers or better. The second part describes a mathematical model of instrumentation using this method. It includes a diffraction modulation transfer function (MTF), an MTF related to optical system aberrations and an optical system defocusing MTF. The simulation results are shown and respective recommendations are given.© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. |
