New Approach to Unveiling Individual Atomic Layers of 2D Materials and Their Heterostructures
| Autor: | Zhengtang Luo, Yao Ding, Irfan Haider Abidi, Xuewu Ou, Lin Gan, Lu-Tao Weng, Man li, Minghao Zhuang, Abhishek Tyagi, Chi Pui Jeremy Wong, Delowar Hossain, Zhaoli Gao, Ruiwen Xue |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Graphene General Chemical Engineering Heterojunction Nanotechnology Hexagonal boron nitride 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Atomic units 0104 chemical sciences law.invention Secondary ion mass spectrometry Interference (communication) Transition metal law Chemical specificity Materials Chemistry 0210 nano-technology |
| Zdroj: | Chemistry of Materials. 30:1718-1728 |
| ISSN: | 1520-5002 0897-4756 |
| DOI: | 10.1021/acs.chemmater.7b05371 |
| Popis: | Visualization of the chemical structures of two-dimensional (2D) materials and their interfaces at the virtually atomic scale is an imperative step toward devising highly efficient ultrathin optoelectronic devices. Herein, we demonstrate a universal method featuring time-of-flight secondary ion mass spectrometry (ToF-SIMS), coupled with the structure simplicity of 2D materials, as a versatile tool to reveal the vertical atomic layers of various two-dimensional (2D) materials including graphene, hexagonal boron nitride (h-BN), and transition metal dichalcogenides (TMDs). We demonstrated that the vertical atomic layers of those 2D materials can be unveiled layer-by-layer using a strategy of ToF-SIMS three-dimensional (3D) analysis developed in this work. Moreover, we found that the extreme surface sensitivity and chemical specificity of ToF-SIMS also enables the examination of the lateral uniformity of 2D materials. During this process, we first removed interference of adsorbed organic contamination by anne... |
| Databáze: | OpenAIRE |
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