| Popis: |
Confidence in the ability to find defects in NDE and SHM using ultrasound depends on knowlege of the strength of the reflection of the ultrasound from the defect. Roughness of a defect, such as on the surface of a crack, has a strong effect on the reflection, but every rough defect has a different surface, so the usual methods of assessing the sensitivity of inspection cannot be used. Research at Imperial College has pursued a stochastic approach to predict the statistical expected scattering. The talk will provide a summary of the method, its results, and its validation using numerical modelling. |
