A method for characterizing mechanical properties of sugar films using a piezoelectric-excited millimeter sized cantilever (PEMC) sensor
| Autor: | Ramji S. Lakshmanan, Raj Mutharasan |
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| Rok vydání: | 2011 |
| Předmět: |
Range (particle radiation)
Materials science Cantilever business.industry Metals and Alloys Analytical chemistry Condensed Matter Physics Piezoelectricity Surfaces Coatings and Films Electronic Optical and Magnetic Materials Membrane Spring (device) Excited state Materials Chemistry Optoelectronics Millimeter Electrical and Electronic Engineering business Sugar Instrumentation |
| Zdroj: | Sensors and Actuators B: Chemical. 160:1304-1308 |
| ISSN: | 0925-4005 |
| Popis: | Resonant-mode cantilevers have been investigated widely for detection of target analyte mass. We examine its application for measuring mechanical property of an organic film. A cantilever resonant frequency depends both on its mass and its spring constant. A change in either one of them causes resonant frequency shifts. Piezoelectric excited millimeter sized cantilever (PEMC) sensors exhibit high mass-change sensitivity (2 fg/Hz) at high-order resonant modes present in the frequency range of 800–1000 kHz. The response of this high-order mode to the formation of a sugar film membrane provides experimental data for characterizing the mechanical properties of the sugar film. Sugar film formation, surprisingly, caused a significant resonant frequency increase of greater than 20 kHz. The high-order mode was highly sensitive to spring constant changes caused by the sugar film and was characterized by varying thickness and temperature of the sugar films. |
| Databáze: | OpenAIRE |
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