A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program

Autor:	Y. L. Chou, W. J. Tsai, G. W. Wu, W. Chang, T. C. Lu, K. C. Chen, C. Y. Lu
Rok vydání:	2023
Zdroj:	2023 IEEE International Reliability Physics Symposium (IRPS).
DOI:	10.1109/irps48203.2023.10117734
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ebea3b84d24678869994ecd2cb5f3d45 https://doi.org/10.1109/irps48203.2023.10117734 Zobrazit plný text záznamu