Correlations of Ba1−xSrxTiO3 Materials and Dielectric Properties

Autor: Wei Yung Hsu, Katsuhiro Aoki, Hung Yu Liu, Robert Tsu, Scott R. Summerfelt, Bruce E. Gnade
Rok vydání: 1994
Předmět:
Zdroj: MRS Proceedings. 361
ISSN: 1946-4274
0272-9172
DOI: 10.1557/proc-361-275
Popis: Thin film barium strontium titanate, Ba1−xSrxTiO3 (BST), has been deposited on Pt bottom electrodes using metal-organic decomposition (MOD). Optimization of BST electric properties, including capacitance density and leakage current, can be achieved by altering the chemical and microstructural attribute of the films. Dielectric properties of BST are strongly dependent on processing temperature, film thickness, composition, and microstructure, which are closely correlated with each other. Nucleation temperatures of BST range from 580°C – 650°C depending on film thicknesses. The chemical composition giving the highest dielectric constant is explained in terms of microstructure; capacitance increases with increasing grain size for the BST films in this study. Capacitance density of 50 fF/μ m2 and leakage current density < 100 nA/cm2 at 1.6 V can be achieved by optimizing BST materials properties. In addition, leakage conduction through the Pt/BST/Pt capacitor is shown to consist of polarization current resulting from Debye relaxation and true leakage current attributed to Schottky electron emission.
Databáze: OpenAIRE
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