Thermal Resistance Formulation and Analysis of III-V FETs Based on DC Electrical Data
| Autor: | David E. Root, Jianjun Xu, Masaya Iwamoto |
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| Rok vydání: | 2021 |
| Zdroj: | 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS). |
| Databáze: | OpenAIRE |
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