Investigation of hygrothermally induced failures in multilayer ceramic capacitors during thermal reflow process

Autor:	Rilwan Kayode Apalowo, Aizat Abas, Zuraihana Bachok, Mohamad Fikri Mohd Sharif, Fakhrozi Che Ani, Mohamad Riduwan Ramli, Muhamed Abdul Fatah bin Muhamed Mukhtar
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 146:115028
ISSN:	0026-2714
DOI:	10.1016/j.microrel.2023.115028
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::eb250757c971578a28e0751f1d8b73b7 https://doi.org/10.1016/j.microrel.2023.115028 Zobrazit plný text záznamu Full Text from ScienceDirect