Measurement and characterization of thin film module reliability

Autor: R.S. Sugimura, C. C. Gonzalez, L. Wen, G.R. Mon, Ronald G. Ross
Rok vydání: 1988
Předmět:
Zdroj: Solar Cells. 24:271-278
ISSN: 0379-6787
DOI: 10.1016/0379-6787(88)90078-6
Popis: As an indication of the evolving nature and continuing growth of photovoltaic technology, thin film amorphous silicon (a-Si) power modules have made their commercial debut during the past two years. Early experience with this technology has highlighted certain failure mechanisms as being the most important to long-term power generation. These include light-induced effects, corrosion of the cell monolithic interconnects, electrochemical corrosion between cells and the module frame, hot-spot heating and UV photodegradation of polymer encapsulants and frame members. Research at the Jet Propulsion Laboratory during 1987 has focused on measuring and characterizing many of these degradation mechanisms. A summary of the results is presented, together with references to recent publications of detailed results in each area.
Databáze: OpenAIRE