Microstructure and thermal oxidation behavior of yttria-stabilized hafnia nanostructured coatings deposited on alumina
Autor: | S.W. Stafford, German Martinez, E. J. Rubio, Vaithiyalingam Shutthanandan, M. Noor-A-Alam, Chintalapalle V. Ramana |
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Rok vydání: | 2013 |
Předmět: |
Thermal oxidation
Materials science biology Scanning electron microscope Surfaces and Interfaces General Chemistry engineering.material Condensed Matter Physics Hafnia biology.organism_classification Microstructure Rutherford backscattering spectrometry Surfaces Coatings and Films Thermal barrier coating Crystallography Coating Chemical engineering Materials Chemistry engineering Yttria-stabilized zirconia |
Zdroj: | Surface and Coatings Technology. 236:142-148 |
ISSN: | 0257-8972 |
DOI: | 10.1016/j.surfcoat.2013.09.004 |
Popis: | Nanostructured yttria-stabilized hafnia (YSH) coatings were grown on α-Al 2 O 3 substrates with variable coating thickness in a wide range of ~ 50 nm to 1 μm. Microstructure and thermal oxidation behavior of the grown YSH coatings were studied employing X-ray diffraction (XRD), Rutherford backscattering spectrometry (RBS), scanning electron microscopy (SEM) and isothermal furnace oxidation testing. The effect of coating thickness on the crystal structure, surface/interface morphology and thermal oxidation was investigated. X-ray diffraction analyses revealed the formation of monoclinic phase for relatively thin coatings ( |
Databáze: | OpenAIRE |
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