Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS Technology
| Autor: | G. Vizkelethy, Matthew J. Gadlage, Robert A. Reed, Lloyd W. Massengill, N. A. Dodds, J. R. Ahlbin, Ronald D. Schrimpf, Nicholas C. Hooten, Bharat L. Bhuva |
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| Rok vydání: | 2011 |
| Předmět: |
Physics
Nuclear and High Energy Physics business.industry Alpha particle Focused ion beam Pulse (physics) Soft error Nuclear Energy and Engineering CMOS Electronic engineering Optoelectronics Transient (oscillation) Electrical and Electronic Engineering business Event (particle physics) Beam (structure) |
| Zdroj: | IEEE Transactions on Nuclear Science. 58:1093-1097 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2011.2112378 |
| Popis: | Pulse widths of single-event transients produced by alpha particles in a 65-nm bulk CMOS technology are reported. The experimental setup and calibration of the alpha particle experiment is described in detail. A focused-ion beam is also utilized to explore how pulse broadening in the test circuit impacts the alpha particle SET measurements. The results of this work show that alpha particles are able to induce transient signals with a width of about 25 ps in this technology. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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