Scanning tunneling microscopy and atomic force microscopy characterization of polystyrene spin-coated onto silicon surfaces
| Autor: | Roy Mathew, W. A. Hendrickson, D. Fennell Evans, T. G. Stange |
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| Rok vydání: | 1992 |
| Předmět: |
Kelvin probe force microscope
Materials science Physics::Instrumentation and Detectors Analytical chemistry Surfaces and Interfaces Conductive atomic force microscopy Scanning capacitance microscopy Condensed Matter Physics Electrochemical scanning tunneling microscope law.invention Condensed Matter::Soft Condensed Matter Scanning probe microscopy law Electrochemistry General Materials Science Scanning tunneling microscope Magnetic force microscope Composite material Spectroscopy Photoconductive atomic force microscopy |
| Zdroj: | Langmuir. 8:920-926 |
| ISSN: | 1520-5827 0743-7463 |
| DOI: | 10.1021/la00039a030 |
| Popis: | Scanning tunneling and atomic force images of polystyrene spin-coated onto silicon surfaces as a function of polymer molecular weight and concentration are presented. |
| Databáze: | OpenAIRE |
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