Study on the mechanism of dark current degradation of HgCdTe photovoltaic devices induced by γ-irradiation

Autor:	张 翔 Zhang Xiang, 李豫东 Li Yu-dong, 马林东 Ma Lin-dong, 王志铭 Wang Zhiming, 刘炳凯 Liu Bingkai, 文 林 Wen Lin, 郭 旗 Guo Qi, 周 东 Zhou Dong, 蔡毓龙 Cai Yu-long
Rok vydání:	2019
Předmět:	Materials science Space and Planetary Science business.industry Photovoltaic system Aerospace Engineering Degradation (geology) Optoelectronics Electrical and Electronic Engineering business γ irradiation Atomic and Molecular Physics and Optics Mechanism (sociology) Dark current
Zdroj:	Infrared and Laser Engineering. 48:916001
ISSN:	1007-2276
DOI:	10.3788/irla201948.0916001
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::eab1deee22b38cec5fa312f265d2832b https://doi.org/10.3788/irla201948.0916001 Zobrazit plný text záznamu