Investigation of single-event transients in voltage-controlled oscillators
| Autor: | D. Lewis, Guofu Niu, Vincent Pouget, W. Chen, Pascal Fouillat, Yann Deval, John D. Cressler, Hugh J. Barnaby |
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| Rok vydání: | 2003 |
| Předmět: |
Physics
Nuclear and High Energy Physics Spectrum analyzer business.industry Event (relativity) Transistor Electrical engineering Hardware_PERFORMANCEANDRELIABILITY Frequency dependence equipment and supplies Laser law.invention Nuclear Energy and Engineering law Control theory Hardware_INTEGRATEDCIRCUITS Radio frequency Electrical and Electronic Engineering business Voltage |
| Zdroj: | IEEE Transactions on Nuclear Science. 50:2081-2087 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | The responses of voltage-controlled oscillators (VCOs) to single-event transients (SETs) are investigated. Laser testing and simulations indicate that ion strikes on critical transistors cause distortions in the oscillating output. The time it takes for the circuit to resume its normal operating condition is limited by the recovery time of the affected transistor(s) and the oscillator startup time. These limits to circuit recovery time are the primary causes of the frequency dependence of SET responses in VCOs. |
| Databáze: | OpenAIRE |
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