Influence of thermal fracture on scaling diode end-pumped lasers to high powers

Autor:	C.L. Wang, Yung-Fu Chen, Li-Shu Lee, T.M. Huang
Rok vydání:	2003
Předmět:	Materials science Dopant business.industry chemistry.chemical_element Laser Neodymium law.invention Optical pumping Optics chemistry law Optoelectronics business Absorption (electromagnetic radiation) Thermal fracture Scaling Diode
Zdroj:	Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Edition. CLEO '99. Conference on Lasers and Electro-Optics (IEEE Cat. No.99CH37013).
DOI:	10.1109/cleo.1999.833979
Popis:	Summary form only given. The authors show that the pump absorption decreases linearly with dopant concentration and, therefore, lowering the concentrations for Nd:YVO/sub 4/ crystals extends the fracture-limited pump power. They determine the optimum dopant concentration for Nd:YVO/sub 4/ crystals in scaling to higher power in a end-pumped geometry.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ea5821775be6bc08a205c0920d6f44a1 https://doi.org/10.1109/cleo.1999.833979 Zobrazit plný text záznamu