GaN field-effect transistor with efficient heat dissipation on Si substrate

Autor: null Pashkovskaya I. V., null Pashkovskii A. B., null Lukashin V. M
Rok vydání: 2023
Zdroj: Technical Physics Letters. 49:51
ISSN: 1726-7471
DOI: 10.21883/tpl.2023.01.55349.19327
Popis: A simple design of a GaN field-effect transistor on a Si substrate with efficient heat removal through polydiamond layers formed on the walls of grounding holes is proposed. According to calculations, as a result of the introduction of such a heat sink with the same average distance between the gate sections, the maximum temperature in the channel of the GaN transistor on the Si substrate decreases significantly and becomes comparable to the maximum temperature in the channel of the GaN transistor on the SiC substrate.. Keywords: GaN FET, ground hole, channel temperature, polydiamond.
Databáze: OpenAIRE