Improved Performance of the Al2O3-Protected HfO2–TiO2 Base Layer with a Self-Assembled CH3NH3PbI3 Heterostructure for Extremely Low Operating Voltage and Stable Filament Formation in Nonvolatile Resistive Switching Memory

Autor: Vadivel Murugan, Twinkle George
Rok vydání: 2022
Předmět:
Zdroj: ACS Applied Materials & Interfaces. 14:51066-51083
ISSN: 1944-8252
1944-8244
Databáze: OpenAIRE