Space radiation and reliability qualifications on 65nm CMOS 600MHz microprocessors

Autor:	Sylvain Clerc, Vincent Huard, J.L. Autran, Cyril Bottoni, Gilles Gasiot, Maximilien Glorieux, L. Hili, L. Dugoujon, Florence Malou, J. M. Daveau, F. Cacho, Philippe Roche, R. Weigand, Fady Abouzeid
Rok vydání:	2013
Předmět:	Microprocessor Integrated injection logic Reliability (semiconductor) CMOS Application-specific integrated circuit Computer science law Electronic engineering Process (computing) Resilience (network) Efficient energy use law.invention
Zdroj:	2013 IEEE International Reliability Physics Symposium (IRPS).
Popis:	Recent space programs have reached the limits of the current space digital ASIC offers, mainly relying on CMOS 180nm. The new ST CMOS 65nm space program described in this paper shows how those limits are overcome. Small modifications to the commercial bulk process, paired with cost effective design reinforcements allow higher density and better energy efficiency while ensuring a strong space-grade resilience. The implementation of a 32-bit SPARC LEON3 microprocessor demonstrates the capabilities of this new technology.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e9bbd46cba5414accceb82869c813bbe https://doi.org/10.1109/irps.2013.6532051 Zobrazit plný text záznamu