| Popis: |
In this paper, we propose a method of Non-contact PIM measurement for array antenna by substituting open-stub extension for low-PIM-termination. DUT(Device Under Test) is excited by the PIM tester placed outside and induced PIM is also detected by it. Since null of the current standing wave should be avoided, it is recommended that tests with open-stubs should be carried out. 2-element array antenna is considered as DUT with PIM source in one element. Under above condition, we propose method that requires only one stub with a certain length. Quarter-wavelength stub is practical in the proposed non-contact PIM-measurement method. |
