Scanning ion-conductance microscope with modulation of the sample position along the Z-coordinate and separate Z-axial and lateral (X, Y) scanning

Autor:	M V Zhukov, S Yu Lukashenko, I D Sapozhnikov, M L Felshtyn, O M Gorbenko, A O Golubok
Rok vydání:	2021
Předmět:	History Computer Science Applications Education
Zdroj:	Journal of Physics: Conference Series. 2086:012074
ISSN:	1742-6596 1742-6588
Popis:	Scanning ion-conductance microscope with independent piezoscanners in the lateral scanning plane XY and Z axis was designed and tested. For precise, fast and safe approach of the nanopipette to the sample surface, a coarse approach system based on a piezoinertial mover was used. Measurements of test periodic polymer structures were carried out using nanopipettes with an inner pipette diameter of about 100-150 nm. The optimal geometric parameters of the nanopipette were found and the resolution of the method was estimated. To increase the stability and reproducibility of SICM images, the Z-modulation of the position of the substrate with the sample was realized using a bimorph piezomembrane.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e95cbee030e1c61e49a4612004bd305c https://doi.org/10.1088/1742-6596/2086/1/012074 Zobrazit plný text záznamu