Characterization of MG-doped InGaN and InALN alloys grown by MBE for solar applications

Autor: D. Hao, Wladek Walukiewicz, Lester F. Eastman, William J. Schaff, Xiaodong Chen, K. D. Matthews, Joel W. Ager, Kin Man Yu
Rok vydání: 2008
Předmět:
Zdroj: 2008 33rd IEEE Photovolatic Specialists Conference.
ISSN: 0160-8371
DOI: 10.1109/pvsc.2008.4922690
Popis: In x Ga 1-x N and In x Al 1-x N alloys are grown via MBE on sapphire substrates. A hole concentration of 7.7×1017 cm−3 is achieved on Mg-doped In 0.04 Ga 0.96 N. When x≫0.11, the Hall samples exhibit strong n-type polarity, whereas p-type polarity is confirmed by hot probe measurement for all Mg-doped InGaN and InAlN samples. Single p-i-n junction solar cells made of the same In x Ga 1-x N alloy composition are developed. Upon illumination by a 325 nm laser, V oc is measured at 2.5 V with a fill factor of 61% for all-GaN cell. Clear photo-responses are also observed in InGaN cells with 0.2 and 0.3 Indium content when illuminated by focused outdoor sunlight.
Databáze: OpenAIRE