Characterization of self-assembled monolayers by using a near-field microwave scanning microprobe
| Autor: | Seungwan Kim, Harutyun Melikyan, Tigran Sargsyan, Kiejin Lee, Jongchel Kim, Arsen Babajanyan, Barry Friedman |
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| Rok vydání: | 2009 |
| Předmět: |
Permittivity
Microprobe Chemistry Metals and Alloys Analytical chemistry Near and far field Self-assembled monolayer Surfaces and Interfaces Surfaces Coatings and Films Electronic Optical and Magnetic Materials Characterization (materials science) Monolayer Materials Chemistry Material properties Microwave |
| Zdroj: | Thin Solid Films. 517:5597-5600 |
| ISSN: | 0040-6090 |
| Popis: | A near-field microwave scanning microprobe (NSMM) technique has been used to investigate the material properties of n -alkanethiol self-assembled monolayers (SAMs) on a gold (Au) surface. We demonstrate that near-field microwave probing technique can achieve the noncontact detection of the thickness of SAMs by measuring the microwave reflection coefficient S 11 at an operating frequency near 5.3 GHz. We also directly image the patterned SAMs by NSMM. The thickness (chain length) of SAMs is determined from the visualized microwave reflection coefficient changes on the Au surface with high sensitivity. This nano-scale measurement of SAMs has a great potential for investigating the surface profile with high sensitivity. |
| Databáze: | OpenAIRE |
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