Chemical analysis of semiconducting and metallic SmS thin films by X-ray photoelectron spectroscopy
| Autor: | Sakae Tanemura, Yukimasa Mori |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Materials science
Chalcogenide business.industry Fermi level Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry Condensed Matter Physics Electron spectroscopy Surfaces Coatings and Films chemistry.chemical_compound symbols.namesake Chemical state Semiconductor chemistry X-ray photoelectron spectroscopy symbols Optoelectronics Thin film Electronic band structure business |
| Zdroj: | Applied Surface Science. 253:3856-3859 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2006.08.011 |
| Popis: | We studied the chemical state of semiconducting and metallic SmS thin films by X-ray photoelectron spectroscopy (XPS), which were fabricated using dual-target magnetron sputtering by controlling the power applied to both metal and chalcogenide targets. On the basis of the valence band spectra obtained, it was suggested that semiconducting SmS has the final state corresponding to the Sm2+(4f6) configuration below the Fermi level, and metallic SmS has mainly the Sm3+(4f5) final state and a virtual band state in the Sm 5d band, contributing to the delocalization of 4f electrons and the emergence of metallic conductivity (4f6d0–4f5d1). Thus, the spectra of our fabricated SmS thin films correspond to the band structure obtained from the dielectric property. This is the first work performed on the intrinsically prepared metallic SmS while the former works done for the sample transformed from semiconductor to metal phase by hard polishing. |
| Databáze: | OpenAIRE |
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