Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI

Autor:	Talha Chohan, Zhixing Zhao, Steffen Lehmann, Wafa Arfaoui, Germain Bossu, Jens Trommer, Stefan Slesazeck, Thomas Mikolajick, Mahesh Siddabathula
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Device and Materials Reliability. 22:387-395
ISSN:	1558-2574 1530-4388
DOI:	10.1109/tdmr.2022.3183630
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e8b08387c202e55df06e7fb7af849de0 https://doi.org/10.1109/tdmr.2022.3183630 Zobrazit plný text záznamu