Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells

Autor:	Zdenek Chobola, Miroslav Lunak, J. Dolensky, Jiri Vanek
Rok vydání:	2012
Předmět:	Materials science Microplasma business.industry Optoelectronics Noise spectroscopy business
Zdroj:	ECS Transactions. 40:177-185
ISSN:	1938-6737 1938-5862
DOI:	10.1149/1.4729101
Popis:	This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e89352e6b29faadbf754a6c66f9cfd86 https://doi.org/10.1149/1.4729101 Zobrazit plný text záznamu