High Yield, Superior Quality and Reliability of IGBT and Power Devices in the Artificial Intelligence Era

Autor:	Min-hwa Chi, Kong Tjien Lim, Alicia Ding, Richard Chang
Rok vydání:	2020
Předmět:	Reliability (semiconductor) business.industry Process (engineering) Computer science media_common.quotation_subject Power semiconductor device Quality (business) Insulated-gate bipolar transistor Artificial intelligence business Power (physics) media_common
Zdroj:	2020 China Semiconductor Technology International Conference (CSTIC).
DOI:	10.1109/cstic49141.2020.9282489
Popis:	Modern artificial intelligence and the internet-of-things (AI/loT) drive many aspects of semiconductor technologies. Power ICs and devices need to achieve superior quality and reliability to match the high performance of AI/loT systems. This is achieved by utilizing AI technology extensively throughout power device design and manufacturing, as well as in multi-level co-optimization, advanced process monitoring, failure analysis (FA) and 3D packaging.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e7e32a3ee5e455ee7dfbd304d6a0eb58 https://doi.org/10.1109/cstic49141.2020.9282489 Zobrazit plný text záznamu