Corrigendum to 'Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy'. [Measurement 188 (2022) 110373]

Autor:	Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow, Krzysztof Kwoka
Rok vydání:	2022
Předmět:	Applied Mathematics Electrical and Electronic Engineering Condensed Matter Physics Instrumentation
Zdroj:	Measurement. 191:110828
ISSN:	0263-2241
DOI:	10.1016/j.measurement.2022.110828
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e7b6fb13dff6919ccdfd881a111db6c9 https://doi.org/10.1016/j.measurement.2022.110828 Zobrazit plný text záznamu Full Text from ScienceDirect