| Autor: |
D. Taupin, C. Zelwer |
| Rok vydání: |
1985 |
| Předmět: |
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| Zdroj: |
Journal of Applied Crystallography. 18:436-441 |
| ISSN: |
0021-8898 |
| DOI: |
10.1107/s0021889885010676 |
| Popis: |
The dimensions of spot integration domains are generally computed using an expansion scheme that takes account of the effects of the oblique incidences of the incident beam on the crystal and of the diffracted beam on the film. Since large cells result in diffraction spots very close to each other, it is necessary to predict their size accurately in order to avoid both the inclusion of parts of neighbouring spots and the non-inclusion of part of the spot under evaluation. General formulae are given for overall spot sizes in the case of a parallelepipedic crystal having two pairs of faces parallel to the spindle axis of the camera. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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