4H-SiC Digital Logic Circuitry Based on P+ Implanted Isolation Walls MESFET Technology

Autor: Mihaela Alexandru, José Millan, Phillippe Godignon, Viorel Banu, M. Vellvehi
Rok vydání: 2013
Předmět:
Zdroj: Materials Science Forum. :1048-1051
ISSN: 1662-9752
Popis: The design and development of SiC integrated circuits (ICs) nowadays is a necessity due to the increasing demand for high temperature intelligent power applications and intelligent sensors. Due to the superior electrical, mechanical and chemical proprieties of 4H-SiC poly-type, 4H-SiC MESFET transistor is a good compromise for ICs on SiC able to work at higher temperatures (HT) than on Si. This paper presents new experimental results of approaching embedded logic gates with SiC MESFETs and resistors, built in junction-isolated tubs. The P+ implantation isolation technology offers important perspectives regarding the integration density of devices per unit area and wafer surface, being able to use far more complex design geometry for modeling ICs on SiC.
Databáze: OpenAIRE