Line-focus acoustic microscopy measurements of Nb/sub 2/O/sub 5//MgO and BaTiO/sub 3//LaAlO/sub 3/ thin-film/substrate configurations
| Autor: | S. R. Gilbert, Michael J. Nystrom, Bruce W. Wessels, B. A. Block, Yung-Chun Lee, Jan Drewes Achenbach |
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| Rok vydání: | 1995 |
| Předmět: |
Materials science
Acoustics and Ultrasonics Magnetoresistance business.industry Surface acoustic wave Analytical chemistry Acoustic microscopy Substrate (electronics) chemistry.chemical_compound Optics chemistry Lanthanum aluminate Crystallite Electrical and Electronic Engineering Thin film Crystal twinning business Instrumentation |
| Zdroj: | IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 42:376-380 |
| ISSN: | 0885-3010 |
| DOI: | 10.1109/58.384445 |
| Popis: | Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAlO/sub 3/, and on Nb/sub 2/O/sub 5//MgO and BaTiO/sub 3//LaAlO/sub 3/ thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb/sub 2/O/sub 5/ thin-film. It has been assumed that the Nb/sub 2/O/sub 5/ films may be considered as essentially isotropic. The measurements for LaAlO/sub 3/ and BaTiO/sub 3//LaAlO/sub 3/ show anomalies which are attributed to twinning in the LaAlO/sub 3/ substrate. > |
| Databáze: | OpenAIRE |
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