| Autor: | V. A. Chubarenko, I. V. Gasenkova, A. V. Galdetskii, N. I. Mukhurov, I. F. Kotova |
|---|---|
| Rok vydání: | 2001 |
| Předmět: |
Materials science
business.industry Scanning electron microscope chemistry.chemical_element Nanotechnology Crystal structure Condensed Matter Physics Electronic Optical and Magnetic Materials Anode Metal Nickel Nanopore chemistry Impurity visual_art Materials Chemistry visual_art.visual_art_medium Microelectronics Electrical and Electronic Engineering business |
| Zdroj: | Russian Microelectronics. 30:187-190 |
| ISSN: | 1063-7397 |
| DOI: | 10.1023/a:1011366726933 |
| Popis: | Anodic alumina containing nickel deposited into its nanopores was investigated using a scanning electron probe microanalyzer and an X-ray microdiffractometer. It was demonstrated that electrochemically deposited nickel contains no foreign impurities, has the crystal structure, and is uniformly distributed over the nanopore height. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink