Modeling of noise and distortion associated with ultra-high-speed modulation of VCSEL with slow-light feedback
| Autor: | Mohamed S. Alghamdi, Ahmed Bakry, Moustafa Ahmed, Fumio Koyama |
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| Rok vydání: | 2015 |
| Předmět: |
Physics
business.industry Relative intensity noise Quantum noise Modulation index Physics::Optics 02 engineering and technology Noise (electronics) Computer Science Applications 020210 optoelectronics & photonics Optics Modulation Pulse-amplitude modulation Modeling and Simulation Distortion 0202 electrical engineering electronic engineering information engineering Electronic engineering Electrical and Electronic Engineering business Group delay and phase delay |
| Zdroj: | International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 29:475-486 |
| ISSN: | 0894-3370 |
| DOI: | 10.1002/jnm.2098 |
| Popis: | This paper presents numerical modeling on the noise properties and signal distortion associated with millimeter-frequency modulation of vertical-cavity surface-emitting laser VCSEL under with a transverse-coupled cavity. The study is based on a time-delay rate equation model that takes into account the multiple round trips in the feedback cavity and the optical loss and phase delay in each round trip. Strong slow-light feedback is found to boost the modulation bandwidth to frequencies approaching 70GHz and induce resonance modulation due to photon-photon resonance PPR over passbands centered on frequencies reaching 90GHz. We show that the relative intensity noise of the VCSEL with resonance modulation is enhanced when the noise frequency approaches the corresponding PPR frequency VCSEL. The same effect applies for the VCSEL with extended carrier-photon resonance CPR at the CPR frequency. The low-frequency part is characterized by flat white noise of level nearly equal to -140dB/Hz. The second-harmonic distortion 2HD values are smaller than -10dB under small-signal modulation and increase to lower than -5dB when the modulation index becomes 0.3. Copyright © 2015 John Wiley & Sons, Ltd. |
| Databáze: | OpenAIRE |
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