Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications
| Autor: | John Kuczewski, Russell Woods, G. Giacomini, Peter Siddons, Antonino Miceli, Wei Chen, J. Mead, Don Pinelli, Jonathan Baldwin, John Okasinski, Graham C. Smith, Jack Fried, Emerson Vernon, Gianluigi De Geronimo, Milutin Stanacevic, Abdul K. Rumaiz, Anthony Kuczewski, Orlando Quaranta |
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| Rok vydání: | 2020 |
| Předmět: |
Nuclear and High Energy Physics
Microprobe Materials science Silicon drift detector 010308 nuclear & particles physics business.industry Detector Linearity Integrated circuit 01 natural sciences Pulse shaping law.invention Full width at half maximum Optics Nuclear Energy and Engineering law 0103 physical sciences Electrical and Electronic Engineering Spectral resolution business |
| Zdroj: | IEEE Transactions on Nuclear Science. 67:752-759 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2020.2976820 |
| Popis: | We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1- $\mu \text{s}$ peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 $e^{-}$ rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an 55Fe source. The channel linearity was better than ± 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm $\times $ 3.9 mm and dissipates 167 mW of static power. |
| Databáze: | OpenAIRE |
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