Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors

Autor:	Mariia Gorchichko, En Xia Zhang, Mahmud Reaz, Kan Li, Peng Fei Wang, Jingchen Cao, Rachel M. Brewer, Ronald D. Schrimpf, Robert A. Reed, Brian D. Sierawski, Michael L. Alles, Jonathan Cox, Steven L. Moran, Subramanian S. Iyer, Daniel M. Fleetwood
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 70:3215-3222
ISSN:	1557-9646 0018-9383
DOI:	10.1109/ted.2023.3265939
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e68fbaf6e6cf221bcf848f3fae253f7b https://doi.org/10.1109/ted.2023.3265939 Zobrazit plný text záznamu