Optical inspection of micro-electromechanical systems
Autor: | Mikhail Bryushinin, Igor A. Sokolov, Sanowar H. Khan, Kenneth T. V. Grattan, P. M. Karavaev |
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Rok vydání: | 2008 |
Předmět: | |
Zdroj: | SPIE Proceedings. |
ISSN: | 0277-786X |
DOI: | 10.1117/12.797559 |
Popis: | We report the results of utilization of wide-gap photorefractive sillenite crystals as adaptive photodetectors (AP) for optical inspection of micro-electromechanical systems. The operation principle of AP is based on two-wave mixing and non-steady-state photoelectromotive force effects in photorefractive crystals. The results of measurements of small vibration amplitudes and resonant frequencies of the diffusely scattering objects and micro-electromechanical systems are given. The presented adaptive interferometric systems are suitable for industrial applications. |
Databáze: | OpenAIRE |
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