Optical inspection of micro-electromechanical systems

Autor: Mikhail Bryushinin, Igor A. Sokolov, Sanowar H. Khan, Kenneth T. V. Grattan, P. M. Karavaev
Rok vydání: 2008
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.797559
Popis: We report the results of utilization of wide-gap photorefractive sillenite crystals as adaptive photodetectors (AP) for optical inspection of micro-electromechanical systems. The operation principle of AP is based on two-wave mixing and non-steady-state photoelectromotive force effects in photorefractive crystals. The results of measurements of small vibration amplitudes and resonant frequencies of the diffusely scattering objects and micro-electromechanical systems are given. The presented adaptive interferometric systems are suitable for industrial applications.
Databáze: OpenAIRE