Accumulated Charge Measurement: Control of the Interfacial Depletion Layer by Offset Voltage and Estimation of Band Gap and Electron Injection Barrier
| Autor: | Kazusuke Maenaka, Hiroyuki Tajima, Toshiaki Tanimura, Sunao Shimomoto, Takeshi Komino, Tomofumi Kadoya, Tokuji Yokomatsu |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Materials science
Input offset voltage business.industry Band gap Charge (physics) Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound General Energy Depletion region chemistry Electron injection Phthalocyanine Optoelectronics Physical and Theoretical Chemistry Charge injection business Voltage |
| Zdroj: | The Journal of Physical Chemistry C. 125:1990-1998 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/acs.jpcc.0c04974 |
| Popis: | This study investigates the charge injection barrier at the phthalocyanine (H2Pc)/Pd using accumulated charge measurement (ACM). Because the hole injection barrier is relatively small, the voltage ... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|