A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies
Autor: | T. Benka, Miroslav Havranek, Vaclav Vrba, Pavel Vancura, Michal Marcisovsky, V. Kafka, J. Popule, M. Marcisovska, G. Neue, L. Tomasek, M. Hejtmanek, Peter Svihra, Z. Janoska |
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Rok vydání: | 2018 |
Předmět: |
Materials science
010308 nuclear & particles physics business.industry Radiation 01 natural sciences 030218 nuclear medicine & medical imaging 03 medical and health sciences 0302 clinical medicine 0103 physical sciences Optoelectronics Dose rate business Instrumentation Mathematical Physics Microelectronic circuits |
Zdroj: | Journal of Instrumentation. 13:C12003-C12003 |
ISSN: | 1748-0221 |
DOI: | 10.1088/1748-0221/13/12/c12003 |
Databáze: | OpenAIRE |
Externí odkaz: |