Robust Rao-Type Tests for Non-destructive One-Shot Device Testing Under Step-Stress Model with Exponential Lifetimes

Autor:	Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo
Rok vydání:	2022
Zdroj:	Building Bridges between Soft and Statistical Methodologies for Data Science ISBN: 9783031155086
DOI:	10.1007/978-3-031-15509-3_4
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e60db2c70d829082cadb9089b03ceefa https://doi.org/10.1007/978-3-031-15509-3_4 Zobrazit plný text záznamu