Microstructural analysis and electro-optic properties of thick epitaxial BaTiO3 films integrated on silicon (001)

Autor:	Marc Reynaud, Zuoming Dong, Hyoju Park, Wente Li, Agham B. Posadas, Jamie H. Warner, Daniel Wasserman, Alexander A. Demkov
Rok vydání:	2022
Předmět:	Physics and Astronomy (miscellaneous) General Materials Science
Zdroj:	Physical Review Materials. 6
ISSN:	2475-9953
DOI:	10.1103/physrevmaterials.6.095201
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e6055afe232da172c0cda77ebb0f8506 https://doi.org/10.1103/physrevmaterials.6.095201 Zobrazit plný text záznamu