Post-annealing effect on the interface morphology and current efficiency of organic light-emitting diodes

Autor:	Kiejin Lee, Taedong Kim, Barry Friedman, Sula Choi, Youngwoon Yoon, Hanju Lee, Kyoungchul Kim, Hyung Keun Yoo
Rok vydání:	2013
Předmět:	Diffraction Materials science Annealing (metallurgy) business.industry Atomic force microscopy Surface finish Condensed Matter Physics Electronic Optical and Magnetic Materials Post annealing Crystallinity Materials Chemistry OLED Optoelectronics Electrical and Electronic Engineering business Diode
Zdroj:	Solid-State Electronics. 79:45-49
ISSN:	0038-1101
Popis:	We studied the post annealing effect on the interface morphology and performance of organic light-emitting diodes (OLEDs) at 80 °C substrate temperature. We observed the crystallinity and roughness changes of each layer in an OLED with ITO/CuPc/NPB/Alq 3 /Al structure at various heat-treatment steps by X-ray diffraction (XRD) and atomic force microscopy (AFM). The roughness changes of each layer affected the current–voltage–luminance (IVL) characteristics of the OLEDs. The best annealing step with the best current efficiency was the sample with annealing at 80 °C for 2 h after the deposition of all organic layers.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e58f423ddf7272bdd3ce51a58d29ea9e https://doi.org/10.1016/j.sse.2012.07.016 Zobrazit plný text záznamu Full Text from ScienceDirect