Modeling Fatigue-Breakdown Dilemma in Ferroelectric Hf0.5 Zr0.5 O2 and optimized Programming Strategies

Autor:	Hsin-Hui Huang, Chen-Yi Cho, Tzu-Yao Lin, Tz-Shiuan Huang, Ming-Hung Wu, I-Ting Wang, Yu-Kai Chang, Chen-Han Chou, Pei-Jean Liao, Hsin-Yun Yang, Yu-De Lin, Po-Chun Yeh, Shyh-Shyuan Sheu, Tuo-Hung Hou
Rok vydání:	2022
Zdroj:	2022 International Electron Devices Meeting (IEDM).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e5870c9144e739b480a5aa9c5bb717b2 https://doi.org/10.1109/iedm45625.2022.10019559 Zobrazit plný text záznamu