An OVT Based on Conoscopic Interference and Position Sensitive Detector
| Autor: | Qiao Tan, Qi Feng Xu, Yifan Huang, Xu Zhikun |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Materials science
Birefringence business.industry 010401 analytical chemistry Detector Linearity 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Light intensity Transducer Optics Interference (communication) Electrical and Electronic Engineering 0210 nano-technology business Instrumentation Voltage Group delay and phase delay |
| Zdroj: | IEEE Sensors Journal. 17:340-346 |
| ISSN: | 2379-9153 1530-437X |
| DOI: | 10.1109/jsen.2016.2629493 |
| Popis: | The measurement mode of the existing optical voltage transducer (OVT) is mostly based on light intensity detection. In such a way, the OVT has some big issues, such as a light intensity dependency, a temperature drift, an additional birefringence in the crystal and a half-wave voltage limitation to its measurement range. A new OVT based on conoscopic interference and bi-dimensional position sensitive detector (PSD) is proposed in the paper, which can convert the electro-optical phase delay of the crystal to a rotation angle of spot pattern, and therefore, a high voltage can be measured by the PSD. Compared with the existing OVT, the measurement mode of the new one is independent of light intensity, capable of measuring the electro-optical phase delay from 0° to 180° linearly and directly, and has a wide measurement range with no restriction of the half-wave voltage. The rotation angle of the spot pattern is positioned by a bi-dimensional PSD and the new OVT has a good linearity better than 0.5%. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|