| Autor: |
Rommel Noufi, Su-Huai Wei, Xuanzhi Wu, Anna Duda, J. Zhou, S.H. Demtsu, Y. Yan, Sally Asher, Wyatt K. Metzger, Glenn Teeter |
| Rok vydání: |
2007 |
| Předmět: |
|
| Zdroj: |
Thin Solid Films. 515:5798-5803 |
| ISSN: |
0040-6090 |
| Popis: |
Phase control is critical for achieving high-performance CdTe cells when Cu x Te is used as a back-contact for CdTe cells. Cu x Te phases are mainly controlled by the Cu/Te ratio, and they can also be affected by post-heat-treatment temperature. Although Cu 2 Te has the highest conductivity, it is unstable and provides more Cu diffusion into the CdS and CdTe films. Cu diffusion into the CdS causes “cross-over”, and Cu diffusion into the CdTe film creates Cu-related defects that lower photogenerated carrier lifetime and result in voltage-dependent collection. A “recontact” experiment clearly indicated that the mechanism giving rise to “roll-over” is the formation of Cu-related oxides, rather than the loss of Cu on the back-contact. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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